Take advantage of our in-depth knowledge and decades of experience on the subject of elemental analysis.
Our services are based on your needs. In consultation with you, we create a custom workflow for the implementation of various methods of analysis in the context of surfaces, interfaces and thin film analysis.
By combining various methods of thin film and surface analysis, we achieve a well-founded and comprehensive knowledge of the samples to be examined.
Our range of services:
Quantitative depth profile analysis of conductive layers
Quantitative depth profile analysis of non-conducting layers
Determining the chemical composition of the base material
(full analysis, bulk )
Other processes in the surface, interface and thin film analysis