Contract analysis
Customized Evaluations to Meet Your Needs.
Profit from our extensive knowledge and experience in contract analysis. We customise our services to fulfill your needs by establishing a personalized workflow in close cooperation with you for surface, interface, and thin-film analysis. By strategically combining different analytical methods, we provide detailed insight into the properties, composition and structure of your samples. Our extensive analysis empowers you to assess and enhance your materials and surfaces efficiently. Trust in our team's expertise to provide precise and pertinent results. Our state-of-the-art GDA product range and dedicated team are here to provide you with the support you need. Please scroll down to the bottom of the page to find our contact form so we can address all your enquiries directly.
Accurate material characterization
Through the integration of thin film and surface analysis, you can acquire detailed information about the properties, composition, and structure of the samples.
Optimize materials and surfaces.
Identify potential weak points and gain a solid basis for decision-making to evaluate and improve your samples.
Our analyses have accompanying applications in research and development, quality assurance, universities, colleges, and many important branches of industry.
Our service spectrum
- Quantitative depth profile analyses of conductive layers
- Quantitative depth profile analyses of non-conductive layers
- Determination of the chemical composition of their base material (full analysis, bulk)
- Further methods in surface, interface, and thin film analysis
In-depth insights of material surfaces
Results
using GDOES
The graphic depicts the depth profile of a coated brass sample, which was analyzed by GDOES.
The excerpt shows a bulk measurement on a low-alloy steel sample. It provides the percentages of various elements such as Fe, C, Si, Mn, P, S, Cr, and Ni. Additionally, the mean, standard deviation, and relative standard deviation are presented in percentages.
The displayed graphic depicts the depth profile of a curved sample, which was measured using the universal sample unit. Our devices measure both conductive and non-conductive layers, covering a wide range of applications.
The graphic aside shows the depth profile of a CIGS solar cell. The performed measurement via GDOES displays the layers of CdS/ZnO on CIGS on glass. In comparison to measurements conducted using REM, the results prove to be more precise and accurate.
The displayed graphic portrays the depth profile of a nitrocarburized sample, with the nitrogen-rich layer measuring a thickness of 7.8 μm. The precise depth profile analysis conducted through GDOES accurately discerns layer interfaces, thereby providing essential insights into the material's structural composition.
In the refinement of solid materials, as in the case of the presented depth profile of a galvanized metal sample using GDOES, the layer thickness and composition can be thoroughly examined.
The presented graphic depicts the depth profile of a nickel-plated copper sample, which was measured using GDOES. This method allows for a detailed depiction of the layer thickness and composition of the nickel coating.